Anomalous Leakage Current Model for Retention Failure in Flash Memories
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概要
- 論文の詳細を見る
- 1999-09-20
著者
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Kamohara Shiro
Semiconductor & Integrated Circuits Hitachi Ltd.
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OKUYAMA Yutaka
Central Research Laboratory, Hitachi Ltd.
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KOBAYASHI Takashi
Central Research Laboratory, Hitachi Ltd.
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KUME Hitoshi
Central Research Laboratory, Hitachi Ltd.
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MANABE Yukiko
Semiconductor & Integrated Circuits, Hitachi Ltd.
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KATO Masataka
Semiconductor & Integrated Circuits, Hitachi Ltd.
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OKUYAMA Kousuke
Semiconductor & Integrated Circuits, Hitachi Ltd.
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KUBOTA Katsuhiko
Semiconductor & Integrated Circuits, Hitachi Ltd.
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Kobayashi Takashi
Central Research Laboratory Hitachi Ltd.
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Kume Hitoshi
Central Research Laboratory Hitachi Ltd.
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Kume Hitoshi
Central Research Laboratory
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Manabe Yukiko
Semiconductor & Integrated Circuits Hitachi Ltd.
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Okuyama Yutaka
Central Research Laboratory Hitachi Ltd.
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Okuyama Kousuke
Semiconductor & Integrated Circuits Hitachi Ltd.
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Kubota Katsuhiko
Semiconductor & Integrated Circuits Hitachi Ltd.
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Kato Masataka
Semiconductor & Integrated Circuits Hitachi Ltd.
関連論文
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