KATO Masataka | Semiconductor & Integrated Circuits, Hitachi Ltd.
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概要
関連著者
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KATO Masataka
Semiconductor & Integrated Circuits, Hitachi Ltd.
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KUME Hitoshi
Central Research Laboratory, Hitachi Ltd.
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Kimura Katsutaka
Central Research Laboratory, Hitachi, Ltd.
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Kume Hitoshi
Central Research Laboratory
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Kimura Katsutaka
Central Research Lab. Hitachi Ltd.
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Adachi Tetsuo
Semiconductor Development Center Hitachi Ltd.
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Kamohara Shiro
Semiconductor & Integrated Circuits Hitachi Ltd.
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OKUYAMA Yutaka
Central Research Laboratory, Hitachi Ltd.
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KOBAYASHI Takashi
Central Research Laboratory, Hitachi Ltd.
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MANABE Yukiko
Semiconductor & Integrated Circuits, Hitachi Ltd.
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OKUYAMA Kousuke
Semiconductor & Integrated Circuits, Hitachi Ltd.
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KUBOTA Katsuhiko
Semiconductor & Integrated Circuits, Hitachi Ltd.
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Kato Masataka
Semiconductor Development Center Hitachi Ltd.
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Ogura Keisuke
Semiconductor Amp Integrated Circuits Division Hitachi Ltd.
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Kobayashi Takashi
Central Research Laboratory Hitachi Ltd.
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Tanaka Toshihiro
Semiconductor Development Center, Hitachi, Ltd.
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Kume H
Hitachi Ltd. Kokubunji‐shi Jpn
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Kume Hitoshi
Central Research Laboratory Hitachi Ltd.
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Manabe Yukiko
Semiconductor & Integrated Circuits Hitachi Ltd.
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Okuyama Yutaka
Central Research Laboratory Hitachi Ltd.
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Kawahara Takayuki
Central Research Laboratory Hitachi Ltd.
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MIYAMOTO Naoki
Hitachi Device Engineering, Co., Ltd.
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SAEKI Syun-ichi
Hitachi Device Engineering, Co., Ltd.
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JYOUNO Yusuke
Semiconductor & Integrated Circuits Division, Hitachi Ltd.
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Saeki Syun-ichi
Hitachi Device Engineering Co. Ltd.
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Okuyama Kousuke
Semiconductor & Integrated Circuits Hitachi Ltd.
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Jyouno Yusuke
Semiconductor & Integrated Circuits Division Hitachi Ltd.
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Kubota Katsuhiko
Semiconductor & Integrated Circuits Hitachi Ltd.
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Kato Masataka
Semiconductor & Integrated Circuits Hitachi Ltd.
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Kato Masataka
Semiconductor & Integrated Circuits Division Hitachi Ltd.
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Tanaka Toshihiro
Semiconductor Development Center Hitachi Ltd.
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Miyamoto Naoki
Hitachi Device Engineering Co. Ltd.
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KAWAHARA Takayuki
Central Research Laboratory, Hitachi Ltd.
著作論文
- Anomalous Leakage Current Model for Retention Failure in Flash Memories
- Programming and Program-Verification Methods for Low-Voltage Flash Memories Using a Sector Programming Scheme
- High-Reliability Programming Method Suitable for Flash Memories of More Than 256Mb