Origins of material contrast in scanning ion microscope images
スポンサーリンク
概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2002-08-01
著者
-
Ohya Kaoru
Faculty Of Engineering The University Of Tokushima
-
ISHITANI Tohru
Naka Division, Hitachi High-Technologies Corporation
-
Ohya K
Faculty Of Engineering The University Of Tokushima
-
Nakagawa M
Customer Center Hitachi Science Systems Limited
-
Madokoro Yuichi
Naka Division Hitachi High-technologies Corporation
-
NAKAGAWA Mine
Customer Center, Hitachi Science Systems, Limited
-
Ohya Kaoru
Faculty Of Engineering The Universiry Of Tokushima
-
Ishitani Tohru
Naka Division Hitachi High-technologies Corporation
-
Ishitani Tohru
Naka Division Design And Manufacturing Group Hitachi High-technologies Corporation
-
Nakagawa Mine
Customer Center Hitachi Science Systems Limited
-
Madokoro Yuich
Naka Division, Hitachi High-Technologies Corporation
関連論文
- Monte Carlo Simulation of Yield and Energy Distribution of Secondary Electrons Emitted from Metal Surfaces
- Simultaneous Calculation of Reflection, Physical Sputtering and Secondary Electron Emission from a Metal Surface due to Impact of Low-Energy Ions
- Role of Electron Cascade in Low-Energy Ion-Induced Electron Emission Statistics
- Comparative Study of Secondary Electron Emission from Tungsten and Beryllium Irradiated by Plasmas
- Contribution of Kinetic and Potential Emission to keV Singly Charged Ion-Induced Electron Emission from a Metal Surface
- Dynamic Simulation of Erosion and Redeposition Patterns and Impurity Depth Profile of an LHD Divertor Plate
- Calculation of Incident Angle Dependence of Ion-Induced Kinetic Electron Emission from Aluminum
- Direct Monte Carlo Simulation of Incident-Angle Dependence of Secondary Electron Emission from Aluminum
- A Monte Carlo Simulation of Ion-Induced Kinetic Electron Emission with a Stochastic Excitation of Electrons in Solids
- Elastic Scattering Cross Sections of Low-Energy Electron in Solids
- Influence of Recoiling Target Atoms on Kinetic Electron Emission from Molybdenum under keV Ion Bombardments
- Incident Angle Dependence of Secondary Electron Emission from Copper with Multiple Elastic Scattering of Primary Electron in the Muffin-Tin Potential
- Monte Carlo Study of Dependence of Secondary Electron Emission from Copper on Incident Angle of keV Primary Electrons
- Deviation from a Poisson Distribution of Proton-Induced Kinetic Electron Emission Statistics from Gold
- Monte Carlo simulation of topographic contrast in scanning ion microscope
- A Semiempirical Monte Carlo Approach to Secondary Electron Emission from a Hydrogen-Implanted Carbon Surface
- Influence of Wall Material on Charge-Exchange Neutral Emission from High-Temperature Hydrogen Plasma
- Secondary Electron Emission from a Hydrogen-Implanted Graphite by Low-Energy Electron Impact
- Elastic Scattering of Low-Energy Electrons, Positrons and Protons in Copper
- Dynamic Simulation of Erosion and Deposition of a Tungsten Surface Due to High-Fluence Bombardment of Carbon Ions in Plasmas
- Surface Roughness Effect on Secondary Electron Emission from Beryllium under Electron Bombardment
- Production of Atomic Neutral Beam by Dissociation of Molecular Ions on Solid Surface
- Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction
- Simulation of Secondary Electron Emission from Solid Surface Irradiated by Plasmas in an Oblique Magnetic Field
- Dynamic Behavior of Sputtering of Tungsten Implanted in Carbon : Surfaces, Interfaces, and Films
- Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy
- Simulation of Kinetic Electron Emission from Beryllium by keV Ion Impacts
- Computer Simulation of Sputtering of Tungsten due to Simultaneous Bombardment with Deuterium, Carborn and Oxygen Ions in Plasmas
- Ion Backscattering and Sputtering of Plasma-Irradiated Carbon and Tungsten Surfaces in an Oblique Magnetic Field
- Dynamic Simulation of Redeposition of Backscattered and Sputtered Particles on Tungsten Irradiated by Plasmas
- Neutralization of Ion Beam on Semiconductive BaTiO_3 Ceramic Surface
- Simulation study on image contrast and spatial resolution in helium ion microscope
- Energy and Angular Distributions of Kinetic Electrons Emitted from a Solid Surface Due to Grazing Incidence of Protons
- Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy
- Origins of material contrast in scanning ion microscope images
- Direct Monte Carlo Simulation of Ion-Induced Kinetic Electron Emission Statistics
- Comparison between Static and Dynamic Simulations of Ion Reflection and SputteringFrom Layered Materials : Surfaces, Interfaces, and Films
- Secondary Electrorn Emission from Hydrogen-Implanted Graphite with Real Depth Profile of Hydrogen
- Dependence of Secondary Electron Yield on the Incident Angle and the Energy of keV Neutrals Bombarding a Metal Surface
- Anisotropy of Elastic Scattering of Low-Energy Electrons in Noble Gases
- Statistical Behavior of Secondary Electron Emission from Copper by Obliquely Incident Electrons at keV Energies
- Production of Atomic-Oxygen Negative-Ion Beam by Positive Ion-Induced Sputtering of Semiconductive BaTiO_3 Ceramic
- Nonlinear Behaviour of High Frequency Electric Field Just before the Initiation of Beam-Plasma Discharge
- Elastic Cross Section for Low-Energy-Proton Scattering in Copper with the Method of Partial Waves
- Differential Cross-Section and Mean Free Path for the Elastic Scattering of Low-Energy Protons in solids Using the Partial-Wave Method
- Deviation from the Inverse Cosine Law upon Incident Angle Dependence of Secondary Electron Emission from Solids under Electron and Proton Bombardments
- Computer Simulation of Erosion and Deposition Patterns on Graphite Target Plates Exposed to Divertor Plasmas
- Stopping Power of Plasma in a Beam-Plasma System
- Statistics of Secondary Electron Emission for Low-Energy Electron Impact on Copper
- A Simple Method to Determine the Energy of keV Neutrals
- Simulation Study on Erosion and Redeposition at Tungsten Surface Exposed to Deuterium Plasma Including Carbon
- Computer simulation study on incident fluence dependence of ion reflection and sputtering processes from layered and mixed materials
- Application of Secondary Electron Emission to Energy Analysis of Energetic Neutrals
- Statistics of Kinetic Secondary Electron Emission with Stochastic Elastic Collision of Ions in Solids
- Comparative study of depth and lateral distributions of electron excitation between scanning ion and scanning electron microscopes
- Influence of Backscattered Particles on Angular Dependence of Secondary Electron Emission From Copper
- Transition behaviour between erosion and deposition on a tungsten surface exposed to deuterium plasmas containing carbon impurities
- Sputtering erosion and redeposition at divertor surfaces exposed to ITER-FEAT edge plasmas
- Dynamic behavior of carbon deposited on tungsten surface due to carbon ion bombardment and its influence on ion-solid interactions
- A Semiempirical Calculation of Ion-Induced Kinetic Electron Emission Statistics
- Deviation from an Inverse Cosine Dependence of Kinetic Secondary Electron Emission for Angle of Incidence at keV Energy
- A Study of a Surface-Type Positive-Ion-Neutral Converter with Oblique Incidence