Statistical Behavior of Secondary Electron Emission from Copper by Obliquely Incident Electrons at keV Energies
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概要
- 論文の詳細を見る
Secondary electron emission of copper bombarded by a keV electron is investigated by using a statistical distribution of the secondary electron yield with a Monte Carlo calculation. The results show that the dependence of the secondary electron yield on the angle of incidence is suppressed from an inverse cosine because of the increase of backscattered electrons emitted from the surface just after the incidence.
- 社団法人応用物理学会の論文
- 1990-08-20
著者
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Mori Ichiro
Faculty Of Engineering The University Of Tokushima
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Ohya Kaoru
Faculty Of Engineering The Universiry Of Tokushima
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Mori Ichiro
Faculty Of Engineering Osaka University
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