Statistics of Secondary Electron Emission for Low-Energy Electron Impact on Copper
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概要
- 論文の詳細を見る
Secondary electron emission statistics of copper bombarded by electrons are simulated with the Monte Carlo technique. Special features of the statistics are a large probability for no secondary electron and a wide spead of the probabilities to more electrons. Dependences of the secondary electron emission on the energy and the angle of incidence are investigated by using the emission statistics, the energy and the angular distibutions of emitted electrons.
- 社団法人応用物理学会の論文
- 1991-04-15
著者
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Ohya Kaoru
Faculty Of Engineering The University Of Tokushima
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Ohya Kaoru
Faculty Of Engineering The Universiry Of Tokushima
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Mori Ichiro
Faculty Of Engineering Osaka University
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