Monte Carlo simulation of topographic contrast in scanning ion microscope
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概要
- 論文の詳細を見る
- 2004-06-01
著者
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Ohya Kaoru
Department Of Electrical And Electronic Engineering Faculty Of Engineering The University Of Tokushi
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ISHITANI Tohru
Naka Division, Hitachi High-Technologies Corporation
関連論文
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- Axial Profile of Balmer-Alpha Emission near a Tungsten Target in the Compact PWI Simulator APSEDAS
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- Dynamic Simulation of Erosion and Deposition of a Tungsten Surface Due to High-Fluence Bombardment of Carbon Ions in Plasmas
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- Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction
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