Dependence of Secondary Electron Emission on the Incident Angle and the Energy of Primary Electrons Bombarding Bowl-Structured Beryllium Surfaces

概要

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A Monte Carlo simulation of the secondary electron emission from beryllium is combined with a model of bowl structure for surface roughness, for analyzing the difference between the electron emissions for normal and oblique incidences. At normal incidence, with increasing the roughness parameter H/W, the primary energy E_<pm> at which the maximum electron yield occurs becomes higher, and at more than the E_<pm>, the decrease in the yield is slower; where H and W are the depth and width of the bowl structure, respectively. The dispersion of incident angle to the microscopic surface causes a small increase in the yield at oblique incidence, whereas the blocking of primary electrons from bombarding the bottom of the structure causes an opposite trend. The strong anisotropy in the polar angular distribution with respect to the azimuthal angle is calculated at oblique incidence.
社団法人プラズマ・核融合学会の論文
1994-12-25