Monte Carlo Approach to Secondary Electron Emission from Rough Surfaces of Beryllium
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概要
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The effect of surface roughness on the secondary electron emission from beryllium bombarded by low-energy (<__- 1 keV) electrons is investigated using a direct Monte Carlo simulation combined with a model of ripple-structure for the roughness. The calculated energy distribution of secondary electrons is in good agreement with the observed distribution in comparison with calculated one for aflat surface. The secondary electron yield, which includes backscattering electrons, depends on the ratio of the depth to the width of the depression in the rough surface; it is approximately independent of each magnitude of the depth and width in the range of 0.1 - 1000nm. The change of the yield with roughness is large enough to explain the scatter of data among different experiments.
- 社団法人プラズマ・核融合学会の論文
- 1994-01-25
著者
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Kawata Jun
Department Of Information Engineering Takuma National College Of Technology
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Ohya Kaoru
Department Of Electrical And Electronic Engineering Faculty Of Engineering The University Of Tokushi
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Kawata Jun
Department Of Information Engineering Takuma National Couege Of Technology
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