Monte Carlo Simulation of Secondary Electron Emission from Rough Surface
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概要
- 論文の詳細を見る
The surface roughness effect on the secondary electron yield, as well as the energy and angular distributions of emitted electrons, is investigated using a direct Monte Carlo simulation of the secondary electron emission from aluminum with a sinusoidal ripple surface. By introducing the roughness into the calculation, the electron yield for normal incidence increases. A low-energy shift of the energy distribution and an angular distribution, being different from the cosine distribution are calculated.
- 社団法人応用物理学会の論文
- 1994-02-15
著者
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KAWATA Jun
Department of Information Engineering, Takuma National College of Technology
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Kawata Jun
Department Of Information Engineering Takuma National College Of Technology
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Ohya Kaoru
Department Of Electrical And Electronic Engineering Faculty Of Engineering The University Of Tokushi
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Ohya Kaoru
Department Of Electrical And Electronic Engineering The University Of Tokushima
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ITOTANI Takayuki
Department of Electrical and Electronic Engineering, The University of Tokushima
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Itotani T
Department Of Electrical And Electronic Engineering The University Of Tokushima
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Itotani Takayuki
Department Of Electrical And Electronic Engineering The University Of Tokushima
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