超高密度分子メモリ-をつくる--"分子ナノエレクトロニクス"の領域が拓かれる
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概要
著者
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松重 和美
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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松重 和美
京都大学工学研究科電子物性工学専攻
関連論文
- Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever
- 超高真空環境下における有機半導体物性
- 超高真空非接触原子間力顕微鏡による有機分子の高分解能観察
- 5a-YF-2 電場印加時のTGSb面におけるドメイン構造変化のAFM観察
- rf スパッタ法による LiNbO_3 薄膜の作製とその電気的特性
- 配向成長したオリゴシラン超薄膜の光学特性
- 銅フタロシアニン薄膜の蒸着時電圧印加による配向変化
- 有機不揮発性メモリー開発を目指したフッ素系鎖状分子の強誘電特性評価とその鎖長効果(有機EL, TFT,及び一般)
- 有機不揮発性メモリー開発を目指したフッ素系鎖状分子の強誘電特性評価とその鎖長効果(有機EL, TFT,及び一般)
- 有機不揮発性メモリー開発を目指したフッ素系鎖状分子の強誘電特性評価とその鎖長効果(有機EL, TFT,及び一般)
- 原子間力顕微鏡を用いたVDFオリゴマー薄膜の局所強誘電特性評価
- 強誘電性有機分子VDFオリゴマーの構造・配向制御と局所分極操作
- エネルギー分散型斜入射X線分光法によるエピ成長強誘電性有機薄膜の構造評価
- 分子ナノエレクトロニクスの展望
- 触覚センサのためのVDFオリゴマーの圧電特性
- Molecular resolution imaging of protein molecules in liquid using frequency modulation atomic force microscopy
- 生きたまま生体分子の姿を見る原子間力顕微鏡 (特集 化学のブレークスルーを支える「革新機器」) -- (化学を躍進させた革新機器の最前線)
- Self-Assembled Monolayers of Alkanethiol and Fluoroalkanethiol Investigated by Noncontact Atomic Force Microscopy
- X線 Pole Figure 法による強誘電性有機低分子薄膜の精密構造解析
- Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy
- X線Pole Figure法による強誘電性有機低分子薄膜の精密構造解析(有機EL及び関連有機材料, 低温poly-Siと有機TFT技術と一般)
- X線Pole Figure法による強誘電性有機低分子薄膜の精密構造解析(有機EL及び関連有機材料, 低温poly-Siと有機TFT技術と一般)
- X線Pole Figure法による強誘電性有機低分子薄膜の精密構造解析(有機EL及び関連有機材料, 低温poly-Siと有機TFT技術と一般)
- X線 Pole Figure 法による強誘電性有機低分子薄膜の精密構造解析
- X線 Pole Figure 法による強誘電性有機低分子薄膜の精密構造解析
- Improvement of Coupling-Out Efficiency of Organic Light-Emitting Devices by Dot Array Structures with Organic Layer(Fabrication of Organic Nano-devices)(Recent Progress in Organic Molecular Electronics)
- Orientation Control of High-Density Polyethylene Molecular Chains Using Atomic Force Microscope
- Submolecular-Resolution Studies on Metal-Phthalocyanines by Noncontact Atomic Force Microscopy
- Investigations of Nanoparticles by Scanning Near-Field Optical Microscopy Combined with Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever
- Investigations of Local Surface Properties by SNOM Combined with KFM Using a PZT Cantilever(Special Issue on Near-Field Optics and Its Applications)
- Fabrication of Nanometer-Scale Pattern Using Current-Controlled Scanning Probe Lithography
- Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact Aomic Force Microscopy Imaging of Molecular Thin Films
- 高分解能非接触原子間顕微鏡による有機分子材料の評価
- Domain Orientation Imaging of PbTiO_3 Single Crystalsby Vertical and Lateral Piezoresponse Force Microscopy
- Molecular Ferroelectricity of Vinylidene Fluoride Oligomer Investigated by Atomic Force Microscopy
- Structures and Ferroelectric Natures of Epitaxially Grown Vinylidene Fluoride Oligomer Thin Films
- Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy
- Structures and Electrical Properties of Fullerene Thin Films on Si(111)-7×7 Surface Investigated by Noncontact Atomic Force Microscopy
- Investigation of Nonswitching Regions in Ferroelectric Thin Films Using Scanning Force Microscopy
- Dynamic Force Microscopy Investigations of C_ Deposited on Si(111) Surface
- Investigation of Surface Potential of Ferroelectric Organic Molecules by Scanning Probe Microscopy
- The Molecular Arrangements of Alkanethiol Self-Assembled Monolayers on Au(111) Studied by Scanning Tunneling Microscopy
- Structures and Local Polarized Domains of Ferroelectric Organic Films Studied by Atomic Force Microscopy
- Structural Study on Self-Assembled Monolayers of Alkanedithiol Molecules
- Characterization of Niobium-Doped Lead Titanate Thin Films
- Electrical Properties of LiNbO_3 Thin Films by RF Magnetron Sputtering and Bias Sputtering
- Theoretical Study on Surface Acoustic Wave Characteristics of LiNbO_3 Films on Sapphire Substrates
- In-plane Observations of RF-sputtered LiNbO_3 Thin Films Using an Energy Dispersive Total-Reflection X-Ray Diffractometer
- 全反射X線分光法による真空蒸着有機超薄膜の形成機構の解明
- エネルギー分散型X線反射率測定による有機EL薄膜のその場構造変化観測
- 有機EL薄膜の全反射X線回折法とAFMによる構造評価
- Simultaneous Analysis of Total Reflection X-Ray Diffraction and Fluorescence from Copper-Phthalocyanine Thin Films during Evaporation Process
- 分子ナノエレクトロニクスの現状と今後の課題
- SPMが広げる表面科学の世界
- Surface potential investigation of carbon nanotube field-effect transistor by point-by-point atomic force microscope potentiometry (Special issue: Carbon nanotube nanoelectronics)
- 有機薄膜における様々なX線回折・散乱技術
- Non-Equilibrium Thermodynamic Theory of 4-Component Lead-Free Solder
- 応用物理分野からみた化学との融合領域を探る : 分子ナノテクノロジーからみた化学の重要性
- Liquidus Temperature Design of Lead-Free Solder
- Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method
- Characteristics of Organic Field Effect Transistors Using Simple Fabricated Nano-Gap Electrode(Fabrication of Organic Nano-devices)(Recent Progress in Organic Molecular Electronics)
- Novel Ultrasonic Soldering Technique for Lead-Free Solders
- 層状ペロブスカイト自己組織化膜を用いた有機FETの発光および電気特性
- ナノギャップ電極の簡易作製法と有機FETへの応用(センサデバイス, MEMS, 一般)
- ナノギャップ電極の簡易作製法と有機FETへの応用(センサデバイス・MEMS・一般)
- ポリ-,オリゴ-シラン分子膜の凝集構造と光学特性 (特集 機能に富んだ材料シリコン)
- エネルギー分散型表面回折法による無機・有機薄膜の構造・配向解析
- エネルギー分散型表面回折法による無機・有機薄膜の構造・配向解析
- 全反射X線回折法によるエピ膜構造・配向のその場計測
- High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method
- ポリシランエピタキシャル膜の構造および光学特性
- ガス雰囲気中でのフタロシアニン薄膜のFET特性とキャリア移動度の測定
- Highly Oriented Nb-Doped Lead Titanate Thin Films by Reactive Sputtering: Electrical Properties
- Thermally Stimulated Current and Polarization Fatigue in Pb (Zr, Ti) O_3 Thin Films
- Highly Oriented Nb-Doped Lead Titanate Thin Films by Reactive Sputtering : Fabrication and Structure Analyses
- Optical Characteristics of Ultrathin Oligosilane Films Prepared by Molecular Beam Deposition Method
- Effect of Substrate Temperature on Molecular Orientation in Evaporated Thin Films of Vinylidene Fluoride Oligomer
- エネルギー分散型斜入射X線分光法(全反射蛍光・回折と反射率・表面伝搬波)
- Two-Dimensional Crystal Growth Process of n-Alkane Molecules Observed Using Scanning Tunneling Microscope
- Electrical Properties of Highly Strained Epitaxial Pb(Zr, Ti)O_3 Thin Films on MgO(100)
- X線表面伝搬波による有機超薄膜の評価
- X線反射率法による高分子薄膜の構造評価
- Correlation between the Photochromic Enhancement in Tungstic Acid and the O-C-H Bond irn Additives
- Dependence of Crystalline Structure and Lattice Parameters on Film Thickness in PbTiO_3/Pt/MgO Epitaxial Structure
- Direct Observation of Photoinduced Gratings in LiNbO_3:Fe Single Crystals Using a Scanning Electron Microscope
- Thermal Effects in Properties of Photovoltaic Currents of Pb(Zr, Ti)O_3 Thin Films
- 新規エネルギー分散型X線回折法を用いたエピタキシャル有機薄膜の3次元逆格子空間構造解析
- Enhancement of Photochromism in Tungstic Acid Gels with Some Organic Additives: Effects of End Groups
- 超高密度分子メモリ-をつくる--"分子ナノエレクトロニクス"の領域が拓かれる
- 有機エピタキシャル薄膜
- エネルギー分散型斜入射X線分光計の開発と薄膜評価への応用
- 全反射X線回折計による有機エピタキシャル結晶の構造・配向解析
- Formation of Epitaxial Twins by Perfluoro-N-Alkane Evaporated on Alkali Halide Crystal
- Scanning Tunneling Microscope Observation of Aggregation Structures in Polar Organic Molecules
- Atomic-Resolution Imaging of Graphite-Water Interface by Frequency Modulation Atomic Force Microscopy