Identification of Graphene Layer Numbers from Color Combination Contrast Image for Wide-Area Characterization

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概要

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• Identification of the number of graphene layers using an optical microscope images taken at various magnifications is investigated from the viewpoint of simple wide-area inspection. For graphene on 300-nm-thick SiO2, combination of red and green color contrast gives more accurate contrast value and provides better contrast even at the low magnification as compared with the single color channel contrast. The color combination with suitable weighting factors taking account of light wavelength and intensity dependences of the system response results in the contrast that agrees well with the theoretical values from Fresnel's law. Simple image processing is also investigated to improve the signal-to-noise ratio (SNR) of the image. Median filtering improves the SNR of the image having high pixel density, whereas dithering is effective for the low magnification image having block noise due to low pixel density.

• 2012-06-25

著者

• KASAI Seiya

  Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University

• Hashim Abdul

  Malaysia-Japan International Institute of Technology, Universiti Teknologi Malaysia, International Campus, 54100 Kuala Lumpur, Malaysia

• Rahman Shaharin

  Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 Skudai, Johor, Malaysia

• Kasai Seiya

  Research Center for Integrated Quantum Electronics (RCIQE) and Graduate School of Information Science and Technology, Hokkaido University, North 13, West 8, Sapporo 060-8628, Japan

• Kasai Seiya

  Research Center for Integrated Quantum Electronics and Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan

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