Reliable Operation of GaInAsP/InP Distributed Feedback Laser with Wirelike Active Regions
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概要
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A continuous-wave (CW) life test of 1550 nm wavelength buried-heterostructure distributed feedback (BH-DFB) lasers with wirelike active regions, fabricated by CH4/H2 reactive-ion-etching (RIE) and organometallic vapor phase epitaxy (OMVPE), was performed at room temperature. No degradations in lasing characteristics were observed after an aging time of 8200 h at a bias current of around 10 times the threshold value.
- 2003-02-15
著者
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Tamura Shigeo
Research Center For Quantum Effect Electronics Tokyo Institute Of Technology
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Ohira Kazuya
Research Center For Quantum Effect Electronics Tokyo Institute Of Technology
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Arai Shigehisa
Research Center For Quantum Effect Electronics Tokyo Institute Of Technology
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Muranushi Kengo
Research Center For Quantum Effect Electronics Tokyo Institute Of Technology
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Onomura Akihiro
Research Center For Quantum Effect Electronics Tokyo Institute Of Technology
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Nunoya Nobuhiro
Research Center For Quantum Effect Electronics Tokyo Institute Of Technology
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Yagi Hideki
Research Center For Quantum Effect Electronics Tokyo Institute Of Technology
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