Raman and X-Ray Studies of InN Films Grown at Different Temperatures by Metalorganic Vapor Phase Epitaxy
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概要
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We used Raman scattering and X-ray diffraction (XRD) methods toinvestigate the properties of InN films deposited at temperaturesranging from 325 to 600°C by metalorganic vapor phase epitaxy(MOVPE). Significant line broadening, softening and intensity evolutionwere observed from films at growth temperatures between 375 and450°C. This can be attributed to the formation of mixedhexagonal and cubic structures and related dislocation defects.As the growth temperature was further increased, the hexagonal phasewas found to be dominant in the deposited InN film.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1998-09-15
著者
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Shu Chen-ke
Department Of Electrophysics National Chiao Tung University
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Pan Yung-chung
Department Of Electrophysics National Chiao-tung University
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CHEN Wen-Hsiung
Department of Electrophysics, National Chiao Tung University
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Chen Wei-kuo
Department Of Electrophysics Chiao-tung University
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Lee Ming-chih
Department Of Electrophysics National Chiao Tung University
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LIN Heng-Ching
Department of Electrophysics, National Chiao Tung University
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Shu Chen-Ke
Department of Electrophysics, National Chiao Tung University,
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extscOu Jehn
Department of Electrophysics, National Chiao Tung University,
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Lin Heng-Ching
Department of Electrophysics, National Chiao Tung University,
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