Current Properties of GaN V-Defect Using Conductive Atomic Force Microscopy

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概要

• 論文の詳細を見る

• Current conduction behavior on GaN V-defect was studied comprehensively using conductive atomic force microscopy. Experimental results indicate that the forward current in the V-defect region is at least three-order higher than that at surrounding area. On the other hand, a snowflake-like leakage current pattern was observed in the V-defect owing to the ease of current breakdown at the crest lines and perimeters. Further static current–voltage measurement suggests that the current flow is governed by Schottky emission and Fowler–Nordheim tunneling for V-defect region and surrounding area, respectively.

• 2006-08-25

著者

• Huang Huai-ying

  Department Of Electrophysics National Chiao Tung University

• CHEN Wen-Hsiung

  Department of Electrophysics, National Chiao Tung University

• Chen Wei-kuo

  Department Of Electrophysics Chiao-tung University

• Lee Ming-chih

  Department Of Electrophysics National Chiao Tung University

• Ku Ching-shun

  Department Of Electrophysics National Chiao Tung University

• Ke Wen-cheng

  Department Of Electrophysics National Chiao Tung University

• Lee Ling

  Department Of Electrophysics National Chiao Tung University

• Chou Wu-Chin

  Department of Electrophysics, National Chiao Tung University, Hsinchu, Taiwan 300, Republic of China

• Huang Huai-Ying

  Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.

• Ke Wen-Cheng

  Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.

• Chou Wu-Chin

  Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.

• Ku Ching-Shun

  Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.

• Ho Chih-Wei

  Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.

• Chen Wei-Kuo

  Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.

• Lee Ling

  Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.

• Lee Ming-Chih

  Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.

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