A Fast Power Current Simulation of Cryptographic VLSI Circuits for Side Channel Attack Evaluation
スポンサーリンク
概要
- 論文の詳細を見る
Capacitor charging modeling accelerates the time-domain simulation of power current of cryptographic VLSI circuits in a CMOS technology. The model finely represents the amount of charges consumed during the operation of Advanced Encryption Standard (AES) cores in a variety of logical implementations, reflecting their internal logical activities. This approach significantly reduces the complexity of power current simulation, and accomplishes acceleration by a factor of more than 200 over the traditional transistor-level circuit simulation. The correlated power analysis (CPA) attack against AES cores is successfully simulated with a conventional circuit simulator, with the models individually derived for 10,000 different cipher texts. The CPA is also experimentally performed against AES cores fabricated in a 65nm as well as 130nm CMOS technologies, using SASEBO measurement standards. The fast power current simulation is demonstrated to be accurate enough to evaluate the vulnerability of AES cores in various logical implementations as well as in different technologies, and exhibits general agreements with the silicon measurements.
著者
-
Sasaki Akihiko
National Institute For Fusion Science
-
Nagata Makoto
Graduate School Of System Informatics Kobe University
-
Fujimoto Daisuke
Graduate School Of System Informatics Kobe University
-
SASAKI Akihiko
National Institute of Advanced Industrial Science and Technology
-
KATASHITA Toshihiro
National Institute of Advanced Industrial Science and Technology
-
HORI Yohei
National Institute of Advanced Industrial Science and Technology
-
SATOH Akashi
Graduate School of Infomatics and Engineering, The University of Electro-Communications
関連論文
- Achievement of 10 keV Central Electron Temperatures by ECH in LHD
- Comparative Study on Effect of Boronization and Titanium Gettering in Compact Helical System Heliotron/Torsatron Device
- A Mixed Circuit and System Level Simulation Technique of Collision-Resistant RFID System(Analog Circuits and Related SoC Integration Technologies)
- Back-End Design of a Collision-Resistive RFID System through High-Level Modeling Approach(Novel Device Architectures and System Integration Technologies)
- Communication Scheme for a Highly Collision-Resistive RFID System( Analog Circuit Techniques and Related Topics)
- Retention and Desorption of Hydrogen and Helium in Inner Wall Material Used for The Large Helical Device (LHD) : Simulation experiments using a glow discharge apparatus
- Neutral Density Measurements by Charge Exchange Analysis on the Heliotron E Plasma
- Hydrogen Ion Species Analysis and Related Neutral Beam Injection Power Assessment in the Heliotron E Neutral Beam Injection System
- Impurity Deposition and Retention of Discharge Gas on Plasma Facing Wall in LHD
- Image Segmentation/Extraction Using Nonlinear Cellular Networks and Their VLSI Implementation Using Pulse-Modulation Techniques(Special Section on Analog Circuit Techniques and Relate)
- A 1-D CMOS PWM Cellular Neural Network Circuit and Resistive-Fuse Network Operation
- Helium Retention of 316L Stainless Steel Used for The First Wall of The Large Helical Device (LHD)
- Chip-to-Chip Half Duplex Spiking Data Communication over Power Supply Rails
- FPGA-Based Intrusion Detection System for 10 Gigabit Ethernet(Reconfigurable System and Applications,Reconfigurable Systems)
- An Hadamard Transform Chip Using the PWM Circuit Technique and Its Application to Image Processing(Special Issue on High-Performance Analog Integrated Circuits)
- Bio-Inspired VLSIs Based on Analog/Digital Merged Technologies
- New Non-Volatile Analog Memory Circuits Using PWM Methods (Special Issue on Integrated Electronics and New System Paradigms)
- An Arbitrary Digital Power Noise Generator Using 65nm CMOS Technology
- Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation
- Experimental Verification of Power Supply Noise Modeling for EMI Analysis through On-Board and On-Chip Noise Measurements(Analog Circuits and Related SoC Integration Technologies)
- An Integrated Timing and Dynamic Supply Noise Verification for Multi-10-Million Gate SoC Designs(Novel Device Architectures and System Integration Technologies)
- Design of RFID Front-end Circuitry Enabling CDMA-based Collision Resistance
- Asymmetric Slope Dual Mode Differential Logic Circuit for Compatibility of Low-Power and High-Speed Operations(Digital,Low-Power, High-Speed LSIs and Related Technologies)
- Logic Synthesis Technique for High Speed Differential Dynamic Logic with Asymmetric Slope Transition(Logic Synthesis, VLSI Design and CAD Algorithms)
- REX : A Reconfigurable Experimental System for Evaluating Parallel Computer Systems( Development of Advanced Computer Systems)
- Dynamic Power-Supply and Well Noise Measurements and Analysis for Low Power Body Biased Circuits(Digital, Low-Power LSI and Low-Power IP)
- POTENTIAL IMPACT OF GLOBAL WARMING IN JAPAN : IMPACT ASSESSMENT OF WARMING ON HUMAN HEALTH
- A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits
- On-Chip Single Tone Pseudo-Noise Generator for Analog IP Noise Tolerance Measurement
- A Diagnosis Testbench of Analog IP Cores for Characterization of Substrate Coupling Strength
- On-Chip In-Place Measurements of V_ and Signal/Substrate Response of Differential Pair Transistors
- Co-simulation of On-Chip and On-Board AC Power Noise of CMOS Digital Circuits
- FOREWORD
- False Operation of Static Random Access Memory Cells under Alternating Current Power Supply Voltage Variation
- Design of Effective Supply Voltage Monitor for Measuring Power Rails of Integrated Circuits
- Measurements and Simulation of Sensitivity of Differential-Pair Transistors against Substrate Voltage Variation
- False Operation of Static Random Access Memory Cells under Alternating Current Power Supply Voltage Variation (Special Issue : Solid State Devices and Materials)
- A Fast Power Current Simulation of Cryptographic VLSI Circuits for Side Channel Attack Evaluation
- Performance Evaluation of Probing Front-End Circuits for On-Chip Noise Monitoring