A Diagnosis Testbench of Analog IP Cores for Characterization of Substrate Coupling Strength
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概要
- 論文の詳細を見る
A diagnosis testbench of analog IP cores characterizes their coupling strengths against on-chip environmental disturbances, specifically with regard to substrate voltage variations. The testbench incorporates multi-tone digital noise generators and a precision waveform capture with multiple probing channels. A prototype test bench fabricated in a 90-nm CMOS technology demonstrates the diagnosis of substrate coupling up to 400MHz with dynamic range of more than 60dB. The coefficients of noise propagation as well as noise coupling on a silicon substrate are quantitatively derived for analog IP cores processed in a target technology, and further linked with noise awared EDA tooling for the successful adoption of such IP cores in SoC integration.
- （社）電子情報通信学会の論文
- 2011-06-01
著者
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Hashida Takushi
Graduate School Of System Informatics Kobe University
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Nagata Makoto
Graduate School Of System Informatics Kobe University
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Hashida Takushi
Graduate School Of System Informatics Kobe Univ.
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ARAGA Yuuki
Graduate School of System Informatics, Kobe University
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Araga Yuuki
Graduate School Of System Informatics Kobe University
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HASHIDA Takushi
Graduate School of Science and Technology, Kobe University
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