On-Chip Multi-Channel Monitoring for Analog Circuit Diagnosis in Systems-on-Chip Integration(<Special Section>Analog Circuits and Related SoC Integration Technologies)
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概要
- 論文の詳細を見る
A highly multi-channel on-chip signal monitor and off-chip waveform acquisition processor established analog circuit diagnosis against environmental disturbances in SoC. An array of 53 distributed probes followed by a single shared waveform acquisition kernel is embedded in a 0.18-μm CMOS experimental on-chip test bench. In combination with the off-chip processor materialized in FPGA and a host PC, fully automated on-chip waveform monitoring achieves high-throughput data acquisition of 300ms per sample point with adaptive 10-bit timing and voltage resolutions at a minimum LSB of 100ps and 400μV, respectively. Analog signals of interest in a 1.5-bit conversion stage of a pipeline ADC were evaluated in terms of their response to substrate noises that globally existed in a chip. On-chip diagnosis derives in-depth findings relating to dynamic, large-signal, and sensitive behaviors of analog circuits in a real SoC environment, far beyond simulations with inevitably limited capacity.
- 一般社団法人電子情報通信学会の論文
- 2007-06-01
著者
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Hashida Takushi
Kobe Univ. Kobe‐shi Jpn
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Hashida Takushi
Graduate School Of System Informatics Kobe University
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Nagata Makoto
Department Of Computer And Systems Engineering Kobe University
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NOGUCHI Koichiro
Graduate School of Science and Technology, Kobe University
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Noguchi Koichiro
Graduate School Of Science And Technology Kobe University
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Hashida Takushi
Graduate School Of System Informatics Kobe Univ.
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HASHIDA Takushi
Graduate School of Science and Technology, Kobe University
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