Sr_2FeMoO_6エピタキシャル薄膜の表面特性(薄膜)

概要

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Thin films of ordered double perovskite Sr_2FeMoO_6 were sputter-deposited on Ba_<0.4>Sr_<0.6>TiO_3-buffered SrTiO_3 substrates, and their surface properties were examined by atomic force microscopy (AFM) and X-ray photoemission spectroscopy (XPS). The Mo 3d spectra of Sr_2FeMoO_6 films showed a multiple peak structure, which originated from the unusual electronic state of metallic Sr_2FeMoO_6. Systematic XPS studies of the air-exposed surface of Sr_2FeMoO_6 film indicated that the surface native barrier was an insulating SrMoO_4. In addition, a TMR junction with the native barrier was fabricated using a convention photolithographic technique, and an MR ratio of 10% was observed at 4.2 K.
社団法人日本磁気学会の論文
2006-05-01