Cross-Sectional Transmission Electron Microscope Observation of Small Structures Made by Field-Induced Scanning Tunneling Microscope Fabrication
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-06-30
著者
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HORI Hidenobu
School of Materials Science,JAIST
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Yamada S
Electronic Imaging And Devices Research Laboratory Fuji Xerox
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Yamada So
Electronic Imaging And Devices Research Laboratory Fuji Xerox Co. Lid.
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Aoki N
School Of Materials Science Japan Advanced Institute Of Science And Technology-hokuriku
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Aoki Nobuyuki
Department Of Electronics And Mechanical Engineering Chiba University
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Aoki Nobuyuki
Department Of Materials Technology Chiba University
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Hori H
Japan Advanced Inst. Sci. And Technol. (jaist) Ishikawa Jpn
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Hori H
School Of Materials Science Japan Advanced Institute Of Science And Technology (jaist)
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Yamada Shoji
Shizuoka Institute Of Science And Technology
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OCHIAI Yuichi
Department of Materials Technology, Chiba University
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YAMADA Satoru
Research Center for Heavy Ion Medicine, Gunma University
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Aoki N
Chiba Univ. Chiba Jpn
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HONG Chulun
Kanagawa Institue of Technology, High-Technology Research Center
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Hong Chulun
Department Of Electrical And Electronic Engineering Kanagawa Institute Of Technology
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Hon Chulun
School Of Materials Science Japan Advanced Institute Of Science And Technology (jaist)
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Hong Chulun
School Of Materials Science Jaist-hokuriku
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Yamada S
Research Center For Heavy Ion Medicine Gunma University
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Ochiai Yuichi
Department Of Materials Technology Chiba University
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Ochiai Yuichi
Department Of Materials Science Chiba University
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Kikutani Tomoyuki
School of Materials Science, Japan Advanced Institute of Science and Technology (JAIST)
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Yamada Shoji
School of Materials Science, Japan Advanced Institute of Science and Technology (JAIST)
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Kikutani Tomoyuki
School Of Materials Science Japan Advanced Institute Of Science And Technology (jaist)
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Hori Hidenobu
School Of Material Science Japan Advanced Institute Of Science And Technology
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OCHIAI Yuichi
Department of Electronics and Mechanical Engineering, Chiba University
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