Recombination Radiation as Possible Mechanism of Light Emission from Reverse-Biased p-n Junctions under Breakdown Condition

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1993-10-15

著者

• Yamada So

  Electronic Imaging And Devices Research Laboratory Fuji Xerox Co. Lid.

• Yamada Shoji

  Shizuoka Institute Of Science And Technology

• KITAO Michihiko

  Research Institute of Electronics, Shizuoka University

• Kitao M

  Shizuoka Univ. Hamamatsu Jpn

• Kitao Michihiko

  Research Institute Of Electronics Shizuoka University

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