Long-Term Photocurrent Decay in Amorphous As_2Se_3 Doped with Ag and Cu
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概要
- 論文の詳細を見る
Long-term photocurrent decays have been investigated on glassy samples of As_2Se_3 containing silver or copper up to 1.5 at.%. A pronounced decrease in photocurrent is observed with the addition of impurities up to 0.1 at.%. Photocurrent decay characteristics for all the samples examined are well represented by the extended exponential curve, which can be derived under the assumption of dispersive transport. Activation energy of transient photocurrent decreases with the addition of silver and copper. Recombination rate increases with impurity content in a low-concentration range. Recombination centers are considered to be created by the addition of impurities. In the case of copper, the recombination rate tends to decrease in the concentration range above 0.1 at.%.
- 社団法人応用物理学会の論文
- 1992-02-15
著者
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Yamada Shoji
Research Institute Of Electronics Shizuoka University
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Kitao Michihiko
Research Institute Of Electronics Shizuoka University
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Satoh K
Tokin Corp. Sendai Jpn
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SATOH Kenji
Research Institute of Electronics, Shizuoka University
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YAMANASHI Yasushi
Research Institute of Electronics, Shizuoka University
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Yamanashi Yasushi
Research Institute Of Electronics Shizuoka University
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Satoh Kenji
Research Institute Of Electronics Shizuoka University
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