A Unified Chemical Bonding Model for Defect Generation in a-SiH: Photo-Induced Defects in Photovoltaic Devices and Current-Induced Defects in TFTs.

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1998-03-30

著者

• YANG Hong

  Department of Pathology, Xuanwu Hospital, Capital University of Medical Sciences

• Yang H

  Kwangju Inst. Sci. And Technol. Kwangju Kor

• Yang Hong

  Microelectronics Centre School Of Electrical And Electronics Engineering Nanyang Technological Unive

• LUCOVSKY Gerald

  Departments of Physics, Materials Science and Engineering, and Electrical and Computer Engineering,

• Yang Hong

  Department Of Information Engineering Xidian University

• Lucovsky Gerald

  Department Of Physics Materials Science And Engineering And Electrical And Computer Engineering Nort

• Yang Hong

  Department Of Chemistry North Carolina State University

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• A Unified Chemical Bonding Model for Defect Generation in a-SiH: Photo-Induced Defects in Photovoltaic Devices and Current-Induced Defects in TFTs.
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