Detection of multivalency charge states in complex and elemental transition metal oxides by X-ray absorption spectroscopy: controlled multivalency as a pathway to device functionality (Special issue: Dielectric thin films for future electron devices: scie
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Lucovsky Gerald
Department Of Physics Materials Science And Engineering And Electrical And Computer Engineering Nort
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Bastos Karen
Department of Physics, North Carolina State University, 2401 Stinson Drive, Raleigh, NC 27695-8202, U.S.A.
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Miotti Leonardo
Department of Physics, North Carolina State University, 2401 Stinson Drive, Raleigh, NC 27695-8202, U.S.A.
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