TEM Moire Pattern and Scanning Auger Electron Microscope Analysis of Anomalous Si Incorporation into MBE-grown Ge on Si(111)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-10-15
著者
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HIBINO Hiroki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
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Hibino H
Ntt Basic Res. Lab. Kanagawa Jpn
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Hibino Hiroki
Ntt Basic Research Laboratories
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Seki M
Ntt Applied Electronics Laboratories:(present Address)ntt Technology Transfer Corporation
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KOBAYASHI Yoshihiro
NTT Basic Research Laboratories
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SEKI Masahiro
NTT Applied Electronics Laboratories
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SUGII Kiyomasa
NTT Basic Research Laboratories
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ISHIZAWA Suzuko
NTT Basic Research Laboratories
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Kobayashi Y
Department Of Nuclear Engineering Graduate School Of Engineering
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Seki M
Ntt Advanced Technologies
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Sugii K
Ntt Opt‐electronics Lab. Ibaraki Jpn
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Seki Masahiro
Ntt Advanced Technology
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SEKI Masahiro
NTT Advanced Technologies
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