Seki M | Ntt Applied Electronics Laboratories:(present Address)ntt Technology Transfer Corporation

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概要

• 同名の論文著者
• Ntt Applied Electronics Laboratories:(present Address)ntt Technology Transfer Corporationの論文著者

関連著者

• Seki M

  Ntt Applied Electronics Laboratories:(present Address)ntt Technology Transfer Corporation

• Seki M

  Ntt Advanced Technologies

• OHMACHI Yoshiro

  NTT Optoelectronics Laboratories

• Fukuda Yukio

  Ntt Applied Electronics Laboratories

• Fukuda Yukio

  Texas Instruments Tukuba Research & Development Center Limited

• Fukuda Y

  Ntt Optoelectronics Laboratories

• Fukuda Yukio

  Tsukuba Research And Development Center Texas Instruments Japan Limited

• Ohmachi Y

  Ntt Optoelectronics Laboratories

• Ohmachi Yoshiro

  Ntt Applied Electronics Laboratories

• KOHAMA Yoshitaka

  NTT Applied Electronics Laboratories

• SEKI Masahiro

  NTT Applied Electronics Laboratories

• KOHAMA Yoshitaka

  NTT Opto-electronics Laboratories

• Fukuda Yuji

  Kansai Photon Science Institute Japan Atomic Energy Agency

• Kohama Y

  Ntt Opto-electronics Laboratories

• Fukuda Yuji

  JAEA

• Seki Masahiro

  Ntt Advanced Technology

• SEKI Masahiro

  NTT Advanced Technologies

• HIBINO Hiroki

  NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation

• Hibino H

  Ntt Basic Res. Lab. Kanagawa Jpn

• Hibino Hiroki

  Ntt Basic Research Laboratories

• KOBAYASHI Yoshihiro

  NTT Basic Research Laboratories

• SEKI Masahiko

  NTT Applied Electronics Laboratories

• SUGII Kiyomasa

  NTT Basic Research Laboratories

• ISHIZAWA Suzuko

  NTT Basic Research Laboratories

• Kobayashi Y

  Department Of Nuclear Engineering Graduate School Of Engineering

• Sugii K

  Ntt Opt‐electronics Lab. Ibaraki Jpn

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著作論文

• Generation of Misfit Dislocations in Si_Ge_x/Si Heterostructures
• Dislocation Reduction in MBE-Grown Ge on Si (001) by in situ Thermal Annealing : Condensed Matter
• Misfit Dislocation Structures at MBE-Grown Si_Ge_x/Si Interfaces : Surfaces, Interfaces and Films
• TEM Moire Pattern and Scanning Auger Electron Microscope Analysis of Anomalous Si Incorporation into MBE-grown Ge on Si(111)

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