ペロブスカイト固溶系Ba(Zn_<1/3>Ta_<2/3>)_<1-X>M_<X>O_<3-δ>における構造不整と電気伝導度

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Diffraction-line broadening was observed in the X-ray diffraction(XRD)profield for samples sintered in a relatively short period in the perovskite-type solid-solution systems, Ba(Zn_<1/3>Ta_<2/3>)_<1-X>M_<X>O_<3-δ> (M=Y, In, Ga), and it decreased with prolonged sintering period. The line broadening was ascribed to a fluctuation of lattice spacing(⊿d/d)that originated from structural imperfections due to ionic displacement, based on a β cos θ plot. Furthermore, as a characteristic tendency, when a larger dopant ion substituted for the(Zn_<1/3>Ta_<2/3>)site in the solid-solution systems a larger initial value of ⊿d/d was observed which also decreased upon prolonged sintering.Electrical conductivity was strongly dependent upon ⊿d/d. The relationship between electrical conductivity and ⊿d/d was discussed from the viewpoint of disordering of the oxide ion.
社団法人日本セラミックス協会の論文
2001-08-01