Simultaneous Measurement of Thermal Diffusivity and Conductivity Applied to Bi-2223 Ceramic Superconductors
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概要
- 論文の詳細を見る
A method to measure the thermal diffusivity α and the conductivity K under an identical experimental setup has been developed and a and K of Bi-2223 oxide superconductor have been measured quasi-simultaneously. The results are analyzed on the basis of the BRT and Tewordt-Wolkhausen theory. The simultaneous measurement makes it possible to estimate the specific heat C and the Debye temperatureΘ_D, as well as to separate the electron and phonon contributions to the diffusivity. The simultaneous measurement also provides a useful check on the reliability and the consistency of the analyses.
- 社団法人日本物理学会の論文
- 1994-08-15
著者
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Naito Tomoyuki
Department Of Materials Science And Technology Faculty Of Engineering Iwate University
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Fujimori H
Tohoku Univ. Sendai
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NOTO Koshichi
Department of Electrical Engineering, Iwata University
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FUJISHIRO Hiroyuki
Faculty of Engineering, Iwate University
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IKEBE Manabu
Faculty of Engineering, Iwate University
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Noto Koshichi
Faculty of Engineering, Iwate University
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IKEBE Manabu
Department of Materials Science and Technology, Faculty of Engineering, Iwate University
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FUJISHIRO Hiroyuki
Department of Materials Science and Technology, Faculty of Engineering, Iwate University
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Noto K
Faculty Of Engineering Iwate University
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Fujishiro H
Faculty Of Engineering Iwate University
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Ikebe M
Faculty Of Engineering Iwate University
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Ikebe Manabu
Department Of Materials Science And Technology Faculty Of Engineering Iwate University
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Naito T
Hitachi Ltd. Ibaraki Jpn
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Noto K
Iwate Univ. Morioka
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Noto Koshichi
Department Of Electrical Engineering Iwata University
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Fujimori H
Res. Inst. Electric And Magnetic Materials Sendai Jpn
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Naito T
Division Of Chemistry Hokkaido University
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Fujishiro Hiroyuki
Department Of Materials Science And Technology Faculty Of Engineering Iwate University
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Nakasugi Tetsuro
Process & Manufacturing Engineering Center Semiconductor Company Toshiba Corp.
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Nakasugi T
Microelectronics Engineering Labs. Toshiba Corporation
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