Analysis of Phase Noise Degradation Considering Switch Transistor Capacitances for CMOS Voltage Controlled Oscillators
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概要
- 論文の詳細を見る
- 2010-06-01
著者
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MATSUZAWA Akira
Department of Physical Electronics, Tokyo Institute of Technology
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OKADA Kenichi
Department of Physical Electronics, Graduate School of Science and Engineering, Tokyo Institute of T
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Okada Kenichi
Department Of Physical Electronics Tokyo Institute Of Technology
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Matsuzawa Akira
Department Of Physical Electronics Tokyo Institute Of Technology
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MURAKAMI Rui
Department of Physical Electronics, Tokyo Institute of Technology
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HARA Shoichi
Department of Physical Electronics, Tokyo Institute of Technology
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Murakami Rui
Department Of Physical Electronics Tokyo Institute Of Technology
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Hara Shoichi
Department Of Physical Electronics Tokyo Institute Of Technology
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Okada Kenichi
Department Of Communications And Computer Engineering Kyoto University
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Matsuzawa Akira
Dep. Of Physical Electronics Tokyo Inst. Of Technol.
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Okada Kenichi
Dep. Of Physical Electronics Tokyo Inst. Of Technol.
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Matsuzawa Akira
Department Of Physical Electronics Graduate School Of Science And Engineering Tokyo Institute Of Technology
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Murakami Rui
Department Of Physical Electronics Graduate School Of Science And Engineering Tokyo Institute Of Technology
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