Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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Lee Jam-wem
National Nano Device Laboratories
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Lee Jam-wem
National Nano Device Laboratory
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Wang Shen-de
Institute Of Electronics National Chiao Tung University
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Chen Chih-yang
Institute Of Electronics National Chiao Tung University
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Lin Hsiao-yi
Toppoly Optoelectronics Corp.
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CHEN Wei-Cheng
Toppoly Optoelectronics Corp.
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YEH Kuan-Lin
Toppoly Optoelectronics Corp.
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LEE Po-Hao
Institute of Electronics, National Chiao Tung University
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SHIEH Ming-Shan
Institute of Electronics, National Chiao Tung University
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LEI Tan-Fu
Institute of Electronics, National Chiao Tung University
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Lei Tan-fu
Institute Of Electronics National Chiao Tung University
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Lee Po-hao
Institute Of Electronics National Chiao Tung University
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Shieh Ming-shan
Institute Of Electronics National Chiao Tung University
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Lei Tan-fu
Institute And Department Of Electronics Engineering National Chiao Tung University
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Chen Chih-yang
Institute Of Electro-optical Engineering National Chiao Tung University
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