Fringing Electric Field Effect on 65-nm-Node Fully Depleted Silicon-on-Insulator Devices
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-09-15
著者
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Ma Ming-wen
Institute And Department Of Electronics Engineering National Chiao Tung University
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CHAO Tien-Sheng
Institute and Department of Electrophysics, National Chiao Tung University
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Chao Tien-sheng
Institute And Department Of Electrophysics National Chiao Tung University
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LEI Tan-Fu
Institute of Electronics, National Chiao Tung University
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KAO Kuo-Hsing
Institute and Department of Electrophysics, National Chiao Tung University
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HUANG Jyun-Siang
Institute and Department of Electrophysics, National Chiao Tung University
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Lei Tan-fu
Institute And Department Of Electronics Engineering National Chiao Tung University
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Kao Kuo-hsing
Institute And Department Of Electrophysics National Chiao Tung University
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Huang Jyun-siang
Institute And Department Of Electrophysics National Chiao Tung University
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