Lee Jam-wem | National Nano Device Laboratories
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概要
関連著者
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Lee Jam-wem
National Nano Device Laboratories
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SZE Simon-M.
National Nano Device Laboratories
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Tai Ya-Li
Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan
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Lien Chen-Hsin
Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan
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Lee Jam-wem
National Nano Device Laboratory
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Wang Shen-de
Institute Of Electronics National Chiao Tung University
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Chen Chih-yang
Institute Of Electronics National Chiao Tung University
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LI Yiming
National Nano Device Labs.
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Li Yiming
National Chiao Tung Univ. Hsinchu Twn
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Lin Hsiao-yi
Toppoly Optoelectronics Corp.
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CHEN Wei-Cheng
Toppoly Optoelectronics Corp.
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YEH Kuan-Lin
Toppoly Optoelectronics Corp.
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LEE Po-Hao
Institute of Electronics, National Chiao Tung University
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SHIEH Ming-Shan
Institute of Electronics, National Chiao Tung University
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LEI Tan-Fu
Institute of Electronics, National Chiao Tung University
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Lei Tan-fu
Institute Of Electronics National Chiao Tung University
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Lee Po-hao
Institute Of Electronics National Chiao Tung University
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Shieh Ming-shan
Institute Of Electronics National Chiao Tung University
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Lei Tan-fu
Institute And Department Of Electronics Engineering National Chiao Tung University
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Chen Chih-yang
Institute Of Electro-optical Engineering National Chiao Tung University
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Li Yiming
National Nano Device Laboratories, Hsinchu 300, Taiwan
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Chen-Hsin Lien
Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan
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Sze Simon-M.
National Nano Device Laboratories, Hsinchu 300, Taiwan
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Jam-Wem Lee
National Nano Device Laboratories, Hsinchu 300, Taiwan
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Lee Jam-Wem
National Nano Device Laboratories, Hsinchu 300, Taiwan
著作論文
- Optimization of the Anti-Punch-Through Implant for Electrostatic Discharge Protection Circuit Design
- Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors
- Optimization of the Anti-Punch-Through Implant for Electrostatic Discharge Protection Circuit Design
- Investigation of Minority Carrier Distribution in Semiconductor-Controlled Rectifier Devices and the Impact on Electrostatic Discharge Applications
- Local Oxidation Fin-Field-Effect-Transistor Structure for Nanodevice Applications