THD Measurement and Compensation for Analog Circuits with Fine CMOS Devices
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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Kobayashi Haruo
Electronic Engineering Department Graduate School Of Engineering Gunma University
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Kobayashi Haruo
The Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Kobayashi Haruo
Sanyo Lsi Design-system Soft Co. Ltd.
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Kobayashi H
The Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Kobayashi Haruo
Gunma Univ. Kiryu‐shi Jpn
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KOMURO Takanori
Agilent Technologies International Japan, Ltd.
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SAKAYORI Hiroshi
Agilent Technologies International Japan, Ltd.
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SOBUKAWA Shingo
NF Corporation
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Komuro T
Agilent Technologies International Japan Ltd.
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Komuro Takanori
Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Sakayori Hiroshi
Agilent Technologies International Japan Ltd.
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Komuro Takanori
Agilent Technologies International Japan Ltd.
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