Production Test Considerations for Mixed-signal IC with Background Calibration
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概要
- 論文の詳細を見る
- 2010-11-01
著者
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KOBAYASHI Haruo
Electronic Engineering Department, Graduate School of Engineering, Gunma University
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Kobayashi Haruo
Electronic Engineering Department Graduate School Of Engineering Gunma University
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Takai Nobukazu
Electronic Engineering Department Graduate School Of Engineering Gunma University
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Takai Nobukazu
Department Of Electronic Engineering Graduate School Of Engineering Gunma University
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Ito Satoshi
Electronic Engineering Department Graduate School Of Engineering Gunma University
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YAGI Takuya
Electronic Engineering Department, Graduate School of Engineering, Gunma University
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TAN Yohei
Electronic Engineering Department, Graduate School of Engineering, Gunma University
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UEMORI Satoshi
Electronic Engineering Department, Graduate School of Engineering, Gunma University
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YAMAGUCHI Takahiro
Electronic Engineering Department, Graduate School of Engineering, Gunma University
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Yagi Takuya
Electronic Engineering Department Graduate School Of Engineering Gunma University
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Tan Yohei
Electronic Engineering Department Graduate School Of Engineering Gunma University
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Uemori Satoshi
Electronic Engineering Department Graduate School Of Engineering Gunma University
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Kobayashi Haruo
Gunma University
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Yamaguchi Takahiro
Electronic Engineering Department Graduate School Of Engineering Gunma University
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Takai Nobukazu
Gunma University
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- FOREWORD
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