Structural Characterization of Si_<0.75>Ge_<0.25> Alloy Layers with Sb/Ge-Mediated Low Temperature-grown Si Buffers

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-05-15

著者

• Rahman Mohammad

  Department Of Animal Science Faculty Of Agriculture Utsunomiya University

• Rahman M

  Department Of Electrical And Electronic Engineering. Faculty Of Engineering. Toyama University

• ZHANG Shuqi

  Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University

• TAMBO Toyokazu

  Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University

• TATSUYAMA Chiei

  Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University

• Zhang Shuqi

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Toyama University

• Tambo T

  Toyama Univ. Toyama

• Tambo Toyokazu

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Toyama University

• Rahman Mohammad

  Department Of Anesthesiology Pharmacology & Therapeutics University Of British Columbia

• Tatsuyama C

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Toyama University

• Tatsuyama Chiei

  Department Of Electonics Faculty Of Engineering Toyama University

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