Structural Transformations During Sb Adsorption on Si(111)-In(4x1) Reconstruction
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-06-01
著者
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TATSUYAMA Chiei
Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University
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Rao Bommisetty
Faculty Of Engineering Toyama University
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Tambo T
Toyama Univ. Toyama
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Tambo Toyokazu
Faculty Of Engineering Toyama University
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Gruznev Dimitry
Faculty Of Engineering Toyama University
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Tatsuyama C
Department Of Electrical And Electronic Engineering Faculty Of Engineering Toyama University
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Tatsuyama Chiei
Faculty Of Engineering Toyama University
関連論文
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- Stability of Two-Step-Growth Bi_2Sr_2CuO_x Films on Si(001) using SrO Buffer Layer(Superconductors)
- In-situ Annealing of Thin SrO Films Grown on Si(001)-2 × 1 by Molecular Beam Epitaxy
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- Some Optical Properties of Layer-Type Semiconductor GaTe
- Raman Study on the High Temperature Transition in V_2O_3
- Growth Temperature Dependence of SrTiO_3 Thin Films by Molecular Beam Epitaxy
- Solid-Phase Epitaxial Growth of SrTiO_3 Thin Films on Si(001) Substrates at Low Temperature
- Development of SnO_2-based Gas Sensors for Detection of Volatile Organic Compounds
- Migration of Conductive Ink using Silver-Cooper Solid Solution Powder
- Electroluminescence in Forward Biased GaSe-SnO_2 Heterojunction
- Structural Transformations During Sb Adsorption on Si(111)-In(4x1) Reconstruction
- In (4×3) Reconstruction Mediated Heteroepitaxial Growth of InSb on Si (001) Substrate
- XPS Study on the Chemical Shifts of Crystalline III-VI Layered Compounds
- Structural Transformations During Sb Adsorption on Si(111)–In($4{\times}1$) Reconstruction
- Effect of In($4\times 1$) Reconstruction Induced Interface Modification on the Growth Behavior of InSb on Si(111) Substrate