In (4×3) Reconstruction Mediated Heteroepitaxial Growth of InSb on Si (001) Substrate
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概要
- 論文の詳細を見る
In the present letter we report the epitaxial growth of 9000-Å-thick InSb on a Si (001) surface via In(4×3) reconstruction by molecular beam epitaxy. The growth was monitored in situ using RHEED, Auger electron spectroscopy, scanning tunneling microscopy and the exsitu characterization was done using X-ray diffraction, atomic force microscopy, and optical microscopy. The heteroepitaxy of InSb on Si (001) surface is achieved despite the presence of a large lattice mismatch (over 19%) by incorporating a 0.5ML In (4×3) reconstruction at the InSb/Si interface. Based on these results a model for the interface formation is developed.
- 社団法人応用物理学会の論文
- 1998-11-01
著者
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TATSUYAMA Chiei
Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University
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Rao Bommisetty
Faculty Of Engineering Toyama University
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Tambo T
Toyama Univ. Toyama
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Tambo Toyokazu
Department Of Electrical And Electronic Engineering Faculty Of Engineering Toyama University
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Tatsuyama C
Department Of Electrical And Electronic Engineering Faculty Of Engineering Toyama University
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Tatsuyama Chiei
Department Of Electonics Faculty Of Engineering Toyama University
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RAO Bommisetty
Department of Electrical & Electronic Engineering, Faculty of Engineering, Toyama University
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ATOJI Makoto
Department of Electrical & Electronic Engineering, Faculty of Engineering, Toyama University
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LI Don
Department of Electrical & Electronic Engineering, Faculty of Engineering, Toyama University
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OKAMOTO Tetsukazu
Department of Electrical & Electronic Engineering, Faculty of Engineering, Toyama University
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Li Don
Department Of Electrical & Electronic Engineering Faculty Of Engineering Toyama University
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Atoji Makoto
Department Of Electrical & Electronic Engineering Faculty Of Engineering Toyama University
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Okamoto Tetsukazu
Department Of Electrical & Electronic Engineering Faculty Of Engineering Toyama University
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