Fourier images feature of lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS technique

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 2001-10-01

著者

• KIMOTO Koji

  Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for M

• MATSUI Yoshio

  Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for M

• Kimoto K

  Advanced Electron Microscope Group Advanced Nano- Characterization Center National Institute For Mat

• Kimoto Koji

  Hitachi Research Laboratory Hitachi Ltd.

• Kimoto Koji

  Advanced Electron Microscope Group Advanced Nano- Characterization Center National Institute For Mat

• Kimoto K

  Hitachi Ltd. Ibaraki Jpn

• Kimoto Koji

  National Institute For Materials Science

• Kimoto Koji

  Advance Materials Laboratory National Institute For Materials Science

• MATSUI Yoshio

  Environmental Pollution Research Institute of Nagoya City

• Matsui Yoshio

  National Institute For Materials Science

• Matsui Y

  Central Research Laboratory Hitachi Ltd.

• Kimoto Koji

  Advanced Materials Laboratory National Institute For Materials Science

• Kimoto Koji

  Hitachi Research Laboratory Hitachi Ltd

• MATUSI Yasuji

  Product Development Laboratory, Mitsubishi Electric Corporation

• Matsui Yoshio

  Advance Materials Laboratory National Institute For Materials Science

• Matsui Yoshio

  Advanced Materials Laboratory National Institute For Materials Science

• Kimoto Koji

  Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for Materials Science

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