Dopant-Dependent Impact of Mn-Site Doping on Critical-State Manganites R_<0.6>Sr_<0,4>MnO_3 (R=La, Nd, Sm, and Gd)(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
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概要
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Versatile features of impurity doping effects on perovskite manganites, R_<0.6>Sr_<0.4>MnO_3, have been investigated by varying the doping species as well as the R-dependent one-electron bandwidth in the single-crystalline specimens. In ferromagnetic-metallic (FM) manganites (R=La, Nd, and Sm), a few percent of Fe substitution dramatically decreases the ferromagnetic transition temperature, leading to a spin glass insulating (SGI) phase for each R species. There, the correlation of charge-orbital ordering in competition with metallic ferromagnetism is effectively induced, which has been observed as an evolution of diffuse electron scattering even in the R=La system with the largest bandwidth. Such a marked impact of Fe doping, widely observed in a variety of FM manganites, virtually results in the reduction in the bandwidth for the system in the critical region near the SGI phase. We have also found a contrastive impact of Cr (or Ru) doping on a SGI manganite (R=Gd). For these dopants, the impurity-induced ferromagnetic magnetization is observed at low temperatures as a consequence of the collapse of the inherent short-range charge-orbital ordering, whereas Fe doping gives only a minimal influence. Thus, the opposite nature of Fe and Cr doping tends to generally hold for bicritical-state manganites with various bandwidths and phase correlation lengths. This may stem from the difference in magnitude of the antiferromagnetic interactions between the Fe-Fe and Cr-Cr couplings.
- 社団法人日本物理学会の論文
- 2008-12-15
著者
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YU Xiuzhen
Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for M
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TOKURA Yoshinori
Department of Applied Physics, University of Tokyo
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MATSUI Yoshio
Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for M
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MIYASAKA Shigeki
Department of Physics, Graduate School of Science, Osaka University
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Yu Xiuzhen
Advanced Electron Microscope Group Advanced Nano- Characterization Center National Institute For Mat
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SAKAI Hideaki
Department of Applied Physics, University of Tokyo
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ITO Kiminori
Department of Applied Physics, University of Tokyo
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NISHIYAMA Takayuki
Department of Applied Physics, University of Tokyo
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Tokura Yoshinori
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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Miyasaka Shigeki
Department Of Applied Physics University Of Tokyo:(present Office)department Of Physics Osaka Univer
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Ito Kiminori
Department Of Applied Physics University Of Tokyo
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Nagai T
Department Of Mineral Resources Engineering School Of Science And Engineering Waseda University
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Nagai Takuro
National Institute For Materials Science
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Matsui Y
Advanced Electron Microscope Group Advanced Nano- Characterization Center National Institute For Mat
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Matsui Y
National Inst. Materials Sci. Ibaraki Jpn
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Matsui Y
National Institute For Research In Inorganic Materials
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Matsui Yoshio
Advanced Electron Microscope Group Advanced Nano- Characterization Center National Institute For Mat
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Matsui Y
Nims Tsukuba Jpn
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Tokura Yoshinori
National Institute Of Advanced Industrial Science And Technology (aist):department Of Applied Physic
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Tokura Yoshinori
Institute Of Materials Structure Science High Energy Accelerator Research Organization:correlated El
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Tokura Yoshinori
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Nishiyama Takayuki
Department Of Applied Physics University Of Tokyo
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Matsui Yoshio
Advance Materials Laboratory National Institute For Materials Science
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Sakai Hideaki
Department Of Applied Physics University Of Tokyo:(present Office)cross-correlated Materials Researc
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Sakai Hideaki
Department Of Applied Mathematics And Physics Faculty Of Engineering Kyoto University
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Tokura Yoshinori
Department Of Applied Physics And Quantum Phase Electronics Center University Of Tokyo
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Miyasaka Shigeki
Department Of Applied Physics University Of Tokyo
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Yu Xiuzhen
Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for Materials Science
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