FUJIOKA Hiromu | Department of Information Systems Engineering, Faculty of Engineering, Osaka University

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概要

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著作論文

Edge Roughness Study of Chemically Amplified Resist in Low-Energy Electron-Beam Lithography Using Computer Simulation
Observation of Nuclear Excitation by Electron Transition (NEET) in ^Au with a Nanosecond Stroboscopic Electron Spectrometer
Three-Dimensional Eye Movement Simulator Extracting Instantaneous Eye Movement Rotation Axes, the Plane Formed by Rotation Axes, and Innervations for Eye Muscles(Medical Engineering)
EB Tester Line Delay Fault Localization Algorithm for Combinational Circuits Considering CAD Layout(Special Issue on Test and Verification of VLSI)
Evaluation of Inspection Process Strategies through VLSI Wafer-Process Simulation Analysis
Fault Diagnosis Technique for Yield Enhancement of Logic LSI Using I_DDQ(Special Section on Reliability Theory and Its Applications)
Verification of Wafer Test Process Simulation in VLSI Manufacturing System and Its Application
Effect of 300mm Wafer Transition and Test Processing Logistics on VLSI Manufacturing Final Test Process Efficiency and Cost
Effect of Express Lots on Production Dispatching Rule Scheduling and Cost in VLSI Manufacturing Final Test Process
Hierarchical Fault Tracing for VLSIs with Bi-directional Busses from CAD Layout Data in the CAD-Linked EB Test System
Automatic Transistor-Level Performance Fault Tracing by Successive Circuit Extraction from CAD Layout Data for VLSI in the CAD-Linked EB Test System
Matching of DUT Interconnection Pattern with CAD Layout in CAD-Linked Electron Beam Test System (Special Issue on LSI Failure Analysis)
Automatic Tracing of Transistor-Level Performance Faults with CAD-Linked Electron Beam Test System
Time- and Space-Focusing Detector System for Real-Time Electron Beam Testing
Measurement of Surface Vacuum Potential from the Energy Spectrum of the Secondary Electron in the Scanning Electron Microscope

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