Nakamae Koji | Faculty Of Engineering Osaka University
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概要
関連著者
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Nakamae Koji
Faculty Of Engineering Osaka University
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Fujioka Hiromu
Faculty Of Engineering Osaka University
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FUJIOKA Hiromu
Department of Information Systems Engineering, Faculty of Engineering, Osaka University
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Nakamae K
Osaka Univ. Suita‐shi Jpn
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Fujioka H
Osaka Univ. Suita‐shi Jpn
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Miura K
Faculty Of Engineering Gunma University
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MIURA Katsuyoshi
Faculty of Engineering, Osaka University
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CHIKAMURA Akihisa
Faculty of Engineering, Osaka University
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Chikamura Akihisa
Faculty Of Engineering Osaka University
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Tanaka Hirohisa
Faculty Of Engineering Osaka University
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Sakamoto Homare
Faculty of Engineering, Osaka University
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Nakagaki Ryo
Faculty of Engineering, Osaka University
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Nakagaki Ryo
Faculty Of Engineering Osaka University
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Kubota Hideharu
Faculty of Engineering, Osaka University
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Kubota Hideharu
Faculty Of Engineering Osaka University
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Sakamoto Homare
Faculty Of Engineering Osaka University
著作論文
- An Analysis of the Economics of the VLSI Development Including Test Cost
- Effect of 300mm Wafer Transition and Test Processing Logistics on VLSI Manufacturing Final Test Process Efficiency and Cost
- Effect of Express Lots on Production Dispatching Rule Scheduling and Cost in VLSI Manufacturing Final Test Process
- Hierarchical Fault Tracing for VLSIs with Bi-directional Busses from CAD Layout Data in the CAD-Linked EB Test System
- Automatic Transistor-Level Performance Fault Tracing by Successive Circuit Extraction from CAD Layout Data for VLSI in the CAD-Linked EB Test System
- Matching of DUT Interconnection Pattern with CAD Layout in CAD-Linked Electron Beam Test System (Special Issue on LSI Failure Analysis)
- Automatic Tracing of Transistor-Level Performance Faults with CAD-Linked Electron Beam Test System
- LSI Failure Analysis with CAD-Linked Electron Beam Test System and Its Cost Evaluation (Special Issue on LSI Failure Analysis)
- Efficient Dynamic Fault Imaging by Fully Utilizing CAD Data in CAD-Linked Electron Beam Test System (Special Issue on LSI Failure Analysis)