Kang Sungho | Dept. Of Electrical And Electronic Eng. Yonsei Univsersity

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概要

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著作論文

A Fast IP Address Lookup Algorithm Based on Search Space Reduction
A Memory-Efficient Pattern Matching with Hardware-Based Bit-Split String Matchers for Deep Packet Inspection
A Pattern Partitioning Algorithm for Memory-Efficient Parallel String Matching in Deep Packet Inspection
Selective Scan Slice Grouping Technique for Efficient Test Data Compression
A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals
Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
A New Analog-to-Digital Converter BIST Considering a Transient Zone(Integrated Electroics)
A New Low Power Test Pattern Generator for BIST Architecture(Semiconductor Materials and Devices)
Efficient Test Generation Using Redundancy Identification

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