Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
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概要
- 論文の詳細を見る
Proposed in this paper is a low power BIST architecture using the pattern mapping method based on the transition freezing method. The transition freezing method generates frozen patterns dynamically according to the transition tendency of an LFSR. This leads to an average power reduction of 60%. However, the patterns have limitations of 100% fault coverage due to random resistant faults. Therefore, in this paper, those faults are detected by mapping useless patterns among frozen patterns to the patterns generated by an ATPG. Throughout the scheme, 100% fault coverage is achieved. Moreover, we have reduced the amount of applied patterns, the test time, and the power dissipation.
- （社）電子情報通信学会の論文
- 2010-03-01
著者
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univsersity
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Kang Sungho
Yonsei University
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KIM Youbean
Yonsei University
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JANG Jaewon
Yonsei University
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SON Hyunwook
Yonsei University
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Son Hyeonuk
Yonsei University
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