A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
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概要
- 論文の詳細を見る
In this paper, we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed method constantly reduces the average and peak power consumption during scan testing.
- （社）電子情報通信学会の論文
- 2010-01-01
著者
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univsersity
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Kang Sungho
Dept. Of Electrical & Electronic Eng. Yonsei University
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KIM Yongjoon
Dept. of Electrical & Electronic Eng., Yonsei University
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PARK Jaeseok
Dept. of Electrical & Electronic Eng., Yonsei University
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Park Jaeseok
Dept. Of Electrical & Electronic Eng. Yonsei University
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Kim Yongjoon
Dept. Of Electrical & Electronic Eng. Yonsei University
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