PARK Jaeseok | Dept. of Electrical & Electronic Eng., Yonsei University
スポンサーリンク
概要
関連著者
-
Kang Sungho
Dept. Of Electrical & Electronic Eng. Yonsei University
-
PARK Jaeseok
Dept. of Electrical & Electronic Eng., Yonsei University
-
Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univsersity
-
KIM Yongjoon
Dept. of Electrical & Electronic Eng., Yonsei University
-
Park Jaeseok
Dept. Of Electrical & Electronic Eng. Yonsei University
-
Kim Yongjoon
Dept. Of Electrical & Electronic Eng. Yonsei University
-
YANG Myung-Hoon
Dept. of Electrical & Electronic Eng., Yonsei University
-
PARK Eunsei
Dept. of Electrical & Electronic Eng., Yonsei University
-
Park Eunsei
Dept. Of Electrical & Electronic Eng. Yonsei University
-
Yang Myung-hoon
Dept. Of Electrical & Electronic Eng. Yonsei University
-
Park Jaeseok
Dept. of Electrical and Electronic Eng., Yonsei University
-
Lim Yoseop
Dept. of Electrical and Electronic Eng., Yonsei University
著作論文
- Selective Scan Slice Grouping Technique for Efficient Test Data Compression
- A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
- Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
- An accurate diagnosis of transition fault clusters based on single fault simulation