Selective Scan Slice Grouping Technique for Efficient Test Data Compression
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概要
- 論文の詳細を見る
This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.
- （社）電子情報通信学会の論文
- 2010-02-01
著者
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univsersity
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Kang Sungho
Dept. Of Electrical & Electronic Eng. Yonsei University
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KIM Yongjoon
Dept. of Electrical & Electronic Eng., Yonsei University
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PARK Jaeseok
Dept. of Electrical & Electronic Eng., Yonsei University
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Park Jaeseok
Dept. Of Electrical & Electronic Eng. Yonsei University
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Kim Yongjoon
Dept. Of Electrical & Electronic Eng. Yonsei University
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