A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
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概要
- 論文の詳細を見る
In this letter a histogram-based BIST (Built-In Self-Test) approach for deriving the main characteristic parameters of an ADC (Analog to Digital Converter) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method reduces the hardware overhead and testing time while detecting any static faults in an ADC.
- （社）電子情報通信学会の論文
- 2008-04-01
著者
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univsersity
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Kang Sungho
Dept. Of Electrical & Electronic Eng. Yonsei University
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KIM Youbean
Yonsei University
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KIM Youbean
Dept. of Electrical and Electronic Eng., Yonsei University
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KIM Kicheol
Dept. of Electrical and Electronic Eng., Yonsei University
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KIM Incheol
Dept. of Electrical and Electronic Eng., Yonsei University
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SON Hyeonuk
Dept. of Electrical and Electronic Eng., Yonsei University
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KIM Kicheol
Department of Electrical and Electronic Engineering, Yonsei University
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Son Hyeonuk
Yonsei University
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Kim Incheol
Department Of Electrical And Electronic Engineering Yonsei University
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Kim Kicheol
Department Of Electrical And Electronic Engineering Yonsei University
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