KIM Youbean | Yonsei University
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概要
関連著者
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univsersity
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KIM Youbean
Yonsei University
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KIM Kicheol
Department of Electrical and Electronic Engineering, Yonsei University
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Son Hyeonuk
Yonsei University
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Kim Incheol
Department Of Electrical And Electronic Engineering Yonsei University
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Kim Kicheol
Department Of Electrical And Electronic Engineering Yonsei University
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Kang Sungho
Dept. Of Electrical & Electronic Eng. Yonsei University
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KIM Youbean
Dept. of Electrical and Electronic Eng., Yonsei University
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KIM Kicheol
Dept. of Electrical and Electronic Eng., Yonsei University
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KIM Incheol
Dept. of Electrical and Electronic Eng., Yonsei University
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SON Hyeonuk
Dept. of Electrical and Electronic Eng., Yonsei University
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Kang Sungho
Department of Electrical & Electronic Engineering, Yonsei University
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Kang Sungho
Yonsei University
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JANG Jaewon
Yonsei University
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SON Hyunwook
Yonsei University
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KIM Youbean
Department of Electrical and Electronic Engineering, Yonsei University
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KIM Incheol
Department of Electrical and Electronic Engineering, Yonsei University
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SON Hyunwook
Department of Electrical and Electronic Engineering, Yonsei University
著作論文
- A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals
- Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
- A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
- A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
- A New Analog-to-Digital Converter BIST Considering a Transient Zone(Integrated Electroics)