A New Analog-to-Digital Converter BIST Considering a Transient Zone(Integrated Electroics)
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概要
- 論文の詳細を見る
A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.
- 社団法人電子情報通信学会の論文
- 2007-11-01
著者
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univsersity
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Kang Sungho
Dept. Of Electrical & Electronic Eng. Yonsei University
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KIM Youbean
Yonsei University
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KIM Youbean
Dept. of Electrical and Electronic Eng., Yonsei University
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KIM Kicheol
Dept. of Electrical and Electronic Eng., Yonsei University
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KIM Incheol
Dept. of Electrical and Electronic Eng., Yonsei University
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SON Hyeonuk
Dept. of Electrical and Electronic Eng., Yonsei University
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KIM Kicheol
Department of Electrical and Electronic Engineering, Yonsei University
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Son Hyeonuk
Yonsei University
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Kim Incheol
Department Of Electrical And Electronic Engineering Yonsei University
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Kim Kicheol
Department Of Electrical And Electronic Engineering Yonsei University
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