Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

スポンサーリンク

概要

論文の詳細を見る
2009-07-01

著者

関連論文

A Fast IP Address Lookup Algorithm Based on Search Space Reduction
A Memory-Efficient Pattern Matching with Hardware-Based Bit-Split String Matchers for Deep Packet Inspection
A Pattern Partitioning Algorithm for Memory-Efficient Parallel String Matching in Deep Packet Inspection
Selective Scan Slice Grouping Technique for Efficient Test Data Compression
A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals
Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
A New Analog-to-Digital Converter BIST Considering a Transient Zone(Integrated Electroics)
A New Low Power Test Pattern Generator for BIST Architecture(Semiconductor Materials and Devices)
Efficient Test Generation Using Redundancy Identification
A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets(Dependable Computing)
An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector
An accurate diagnosis of transition fault clusters based on single fault simulation
A memory-efficient heterogeneous parallel pattern matching scheme in deep packet inspection

もっと見る

スポンサーリンク