KIM Yongjoon | Dept. of Electrical & Electronic Eng., Yonsei University
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概要
関連著者
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univsersity
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Kang Sungho
Dept. Of Electrical & Electronic Eng. Yonsei University
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KIM Yongjoon
Dept. of Electrical & Electronic Eng., Yonsei University
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PARK Jaeseok
Dept. of Electrical & Electronic Eng., Yonsei University
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Park Jaeseok
Dept. Of Electrical & Electronic Eng. Yonsei University
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Kim Yongjoon
Dept. Of Electrical & Electronic Eng. Yonsei University
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YANG Myung-Hoon
Dept. of Electrical & Electronic Eng., Yonsei University
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PARK Eunsei
Dept. of Electrical & Electronic Eng., Yonsei University
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Park Eunsei
Dept. Of Electrical & Electronic Eng. Yonsei University
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Yang Myung-hoon
Dept. Of Electrical & Electronic Eng. Yonsei University
著作論文
- Selective Scan Slice Grouping Technique for Efficient Test Data Compression
- A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
- Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time